Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
insights from industryFernando C. Castro, Ph.D.Applications ScientistGatan In this interview, Fernando C. Castro, Ph.D., an Applications Scientist at Gatan, talks to AZoMaterials about the new ...
What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback