Thyroid cancer is the most common endocrine cancer, affecting more people each year as detection rates continue to rise.

Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly and efficiently. Typically, they use volume scan diagnosis to generate ...

Dynamic PET images of 100 ms frames alternating between end-diastolic and end-systolic phases of five cardiac cycles. (Courtesy: PNAS 10.1073/pnas.1917379117) The researchers developed a method to ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...