Beam analysis and structural modelling techniques underpin the design and evaluation of slender load-bearing elements across civil, mechanical and aerospace engineering. Classical theories such as ...

After years of R&D and promises, multi-beam electron-beam technology is delayed and late to the market. The technology requires more funding and work than previously thought. And generally, the ...

Wafer inspection, the science of finding killer defects in chips, is reaching a critical juncture. Optical inspection, the workhorse technology in the fab, is being stretched to the limit at advanced ...