On the other hand, Gallium focused ion beam (FIB) milling can only reasonably produce cross-sections of samples that are 20 ...
Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
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