LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...
With its 400-MHz bandwidth, the HVD3220 differential probe from Teledyne LeCroy permits in-circuit GaN and SiC system testing. The high-voltage probe carries a 1500-VDC CAT III rating, as well as a ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Santa Rosa, CA. Keysight Technologies has introduced two extreme-temperature probing solutions: the N7007A extreme-temperature 400-MHz passive probe and the N7013A extreme-temperature extension kit ...
In an extreme heat environment, such as during the sintering of powdered metals, in solid waste incinerators, or in oil or gas fired-furnaces, thermocouple probes need to be able to withstand extreme ...
The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...
It’s remarkable how tiny electronics have become. Heaven knows what an old-timer whose experience started with tubes must think, to go from solder tags to SMD in a lifetime is some journey. Even the ...
NASA is launching a small probe Wednesday that will crash head-on into a small asteroid next fall at some 15,000 mph to test the feasibility of one day nudging a threatening body off course just ...
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