For almost 20 years, researchers and semiconductormanufacturers have been trying to developa practical analog BIST (built-in self-test) formixed-signal ICs. By enabling mixed-signal ICtesting on ...
Staff conducted a survey of stress testing practices among selected national central banks and supervisory authorities. The online survey was undertaken in November 2011 as part of the preparatory ...
Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
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