White light interferometry (WLI) is a non‐contact optical method that exploits the interference of broadband light to obtain high‐resolution three‐dimensional maps of surface topographies. By ...

White light interferometry (WLI) is a contact-free optical method for measuring surface height. It uses the phase difference between the light reflected off a reference mirror and the target sample to ...

Optical Profilometry employs light to measure surface contours and roughness by analyzing the interaction between light waves and the surface under examination. It utilizes various principles such as ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...