Parallel piezo aligners with fly height sensors enable faster PIC wafer testing. (Nanowerk News) PI (Physik Instrumente) announced a new technology platform for electro-optical wafer-level testing ...
SAN FRANCISCO, Jan. 21, 2026 /PRNewswire/ -- PI (Physik Instrumente) announced a new technology platform for electro-optical wafer-level testing designed to validate electrical and optical device ...
Abstract: Winding deformation is an important contributor to power transformer faults and forced outages. Effective and mature online detection methods are still lacking. The online frequency response ...
Slips and falls are significant public health concerns, making slip-resistant footwear an essential component of prevention. This study aimed to develop an automated slip detection algorithm, designed ...
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