The rapid development of AI and high-performance computing (HPC) chips is providing long-term demand support for the ...

New lightweight artificial resistive loads deliver precise, field-ready load simulation to improve meter testing ...

Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.

Abstract: The spatial distribution of a transduction efficiency over the air-coupled probe surface was proposed as a convenient tool for the probe integrity inspection. In this research, a parabolic ...

Digital multimeters (DMM), once called voltmeters, have been described as the tape measure for engineers in the new millennium. With electronics and electrical circuits included in almost every ...

MANILA, Philippines — Philippine National Police (PNP) chief Gen. Jose Melencio Nartatez Jr. ordered an investigation into supposedly fake medical test results for President Ferdinand Marcos Jr.