Abstract: A structured light system composed of the digital devices and phase-shifting method is widely used for the accurate three-dimension profile measurement ...
Abstract: This paper investigates Hot Carrier Injection (HCI) behavior on 14nm FinFET Input/Output (IO) device. Junction profile at drain extension region is a key factor in improving HCI degradation.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results